Probing defects in ZnO by persistent phosphorescence

Journal title: Opto-Electronic Advances

Authors: Honggang Ye, Zhicheng Su, Fei Tang, Yitian Bao, Xiangzhou Lao, Guangde Chen, Jian Wang, Shijie Xu*

Subject(s): Electrical and Electronic Engineering, Engineering, Nanotechnology, Technology, Remote Sensing, Optics

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