Scanning cathodoluminescence microscopy: applications in semiconductor and metallic nanostructures Journal title: Opto-Electronic Advances Authors: Zhixin Liu, Meiling Jiang, Yanglin Hu, Feng Lin, Bo Shen, Xing Zhu, Zheyu Fang* Subject(s): Electrical and Electronic Engineering, Engineering, Nanotechnology, Technology, Remote Sensing, Optics
