1/f noise study as a non-destructive test to check MOSFET

Abstract

1/f noise studies play significant role in choosing the band of frequency in which a device can be commendably used. This property is used to check the MOSFET without disturbing its physical structure. A MOSFET is used for intensifying or swapping electronic signals since it is a semiconductor gadget and also helps the electronic devices to run at a high capacity than they would otherwise. This particular device allows for parallel currents to distribute their power. In the present paper1/f noise and nonlinear effects in MOSFETs IRF 340, IRF 440 and IRF 640 are studied. The MOSFETs IRF 440 and IRF 640 show quite a large deviation compared to 1/f line in the lower frequency region while IRF 340 1/f nature matches it at low frequency.

Authors and Affiliations

P. Ananda, S. Victor Vedanayakam, K. Thyagarajan, N. Vijaya Lakshmi

Keywords

Related Articles

A Study of Triangle Current Charge Method in Ni-MH Battery

This study propose the charging method from the triangle current charge method in Ni-MH battery. By using microcontroller board (PIC24FJ128GB110) to control the battery charging circuit. The charger recorded the battery...

Operation Strategy of Electric Motors for Water Pumping On Malang City Regional Water Supply Company (Pdam Kota Malang) For Electrical Energy Efficiency Improvement

PDAM Kota Malang (Malang City Regional Water Supply Company) has several pumping stations that operate the water pump motors 24/7 with no breakdown period, while others operate the motors in rolling breakdown timing. Bad...

Gut Microbiota: The Missing Link in Obesity Induced Nonalcoholic Liver Disease

Background and objective: Recent research has elucidated a close association between intestinal microbiota, obesity, insulin resistance and nonalcoholic hepatic injury. Various studies have also indicated an increase in...

Network Reconfiguration in Distribution Systems Using Harmony Search Algorithm

This manuscript explores feeder reconfiguration in distribution networks and presents an efficient method to optimize the radial distribution system by means of simultaneous reconfiguration. Network Reconfiguration of ra...

Automatic water level controller using NOR Gates

Automatic water level controller circuit is a simple electronics project. It can automatically switch ON and OFF the domestic water pump set depending on the tank water level. You can implement this motor driver circuit...

Download PDF file
  • EP ID EP388558
  • DOI 10.9790/1676-1301017985.
  • Views 99
  • Downloads 0

How To Cite

P. Ananda, S. Victor Vedanayakam, K. Thyagarajan, N. Vijaya Lakshmi (2018). 1/f noise study as a non-destructive test to check MOSFET. IOSR Journals (IOSR Journal of Electrical and Electronics Engineering), 13(1), 79-85. https://europub.co.uk/articles/-A-388558