A Comparative Study of Scanning Electron Microscopy (SEM) of Multilayer ZNS and CDS Thin Films

Abstract

The first thin solid films were obtained by electrolysis in 1864, B White Bunsen and Grover obtained metallic film in the year 1852, by thermal evaporation on explosion of a current carrying metal wire. The usefulness of optical properties of metal films and scientific curiosity about the behavior of two dimensional solid have been responsible for the immense interest in the study of the science and technology of thin films.In this paper we shall study the SEM of multilayer Zns and CdS thin films.

Authors and Affiliations

Jitendra Singh, Kapil Sirohi, Pushpendra Singh, Vishal Kumar Sharma

Keywords

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  • EP ID EP20918
  • DOI -
  • Views 317
  • Downloads 4

How To Cite

Jitendra Singh, Kapil Sirohi, Pushpendra Singh, Vishal Kumar Sharma (2015). A Comparative Study of Scanning Electron Microscopy (SEM) of Multilayer ZNS and CDS Thin Films. International Journal for Research in Applied Science and Engineering Technology (IJRASET), 3(6), -. https://europub.co.uk/articles/-A-20918