A Comparative Study of Scanning Electron Microscopy (SEM) of Multilayer ZNS and CDS Thin Films
Journal Title: International Journal for Research in Applied Science and Engineering Technology (IJRASET) - Year 2015, Vol 3, Issue 6
Abstract
The first thin solid films were obtained by electrolysis in 1864, B White Bunsen and Grover obtained metallic film in the year 1852, by thermal evaporation on explosion of a current carrying metal wire. The usefulness of optical properties of metal films and scientific curiosity about the behavior of two dimensional solid have been responsible for the immense interest in the study of the science and technology of thin films.In this paper we shall study the SEM of multilayer Zns and CdS thin films.
Authors and Affiliations
Jitendra Singh, Kapil Sirohi, Pushpendra Singh, Vishal Kumar Sharma
Keywords
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