A Review Paper on Memory Testing using BIST
Journal Title: GRD Journal for Engineering - Year 2016, Vol 1, Issue 4
Abstract
In this review paper, Built-in self-test has been studied. This Built-in Self-Test (BIST) technique not only helpful from economically but also it gives test logic for the test pattern. This paper concluded basic test problems and some reliable methods of solution discussed in this paper while a studied level of BIST. The basic concept of BIST that it provides a path by which system could test itself.
Authors and Affiliations
Ritu Singh Thakur, Akanksha Awasthi
Keywords
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