A Review Paper on Memory Testing using BIST

Journal Title: GRD Journal for Engineering - Year 2016, Vol 1, Issue 4

Abstract

In this review paper, Built-in self-test has been studied. This Built-in Self-Test (BIST) technique not only helpful from economically but also it gives test logic for the test pattern. This paper concluded basic test problems and some reliable methods of solution discussed in this paper while a studied level of BIST. The basic concept of BIST that it provides a path by which system could test itself.

Authors and Affiliations

Ritu Singh Thakur, Akanksha Awasthi

Keywords

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  • EP ID EP216700
  • DOI -
  • Views 104
  • Downloads 0

How To Cite

Ritu Singh Thakur, Akanksha Awasthi (2016). A Review Paper on Memory Testing using BIST. GRD Journal for Engineering, 1(4), 94-98. https://europub.co.uk/articles/-A-216700