An Efficient Fault Tolerance Technique for Through-Silicon-Vias in 3-D ICs
Journal Title: International Journal of Advanced Computer Science & Applications - Year 2018, Vol 9, Issue 7
Abstract
Three-dimensional integrated circuits (3D-ICs) based on Through-Silicon-Vias (TSVs) interconnection technology appeared as a viable solution to overcome problems of cost, reliability, yield and stacking area. In order to be commercially feasible, the 3D-IC yield must be as high as possible, which requires a tested and reparable TSVs. To overpass this challenge, an integration of interconnect built-in self-test (IBIST) methodology for 3D-IC is given in the aims to test the defectives TSVs. Once the interconnection has been tested, the result extracted from IBIST initiate the repairing defectives TSVs based on the built-in self-repair (BISR) structure. This paper superposed two fault tolerance techniques in particularly the redundant TSV and the time division multiplexing access (TDMA) in case of multi defectives TSV. This novel repair architecture increase the yield of 3D-ICs in a high failure rate. It leads to 100% reparability for 30% failure rate. A parallel processing approach of the proposed structure is presented to accelerate the test and repair operations. Achieved experimental results with the proposed methodology scheme show a good performance in terms of repair rate and yield.
Authors and Affiliations
Mohamed BENABDELADHIM, Wael DGHAIS, Fakhreddine ZAYER, Belgacem HAMDI
Keywords
Related Articles
- EP ID EP358601
- DOI 10.14569/IJACSA.2018.090737
- Views 54
- Downloads 0
A Prediction-based Curriculum Analysis using the Modified Artificial Bee Colony Algorithm
Due to the vast amount of students’ information and the need of quick retrieval, establishing databases is one of the top lists of the IT infrastructure in learning institutions. However, most of these institutions do no...
e-Learning Tools on the Healthcare Professional Social Networks
According to many studies, professional social networks are not widespread in the health care environment, especially doctors. The article is devoted to two advanced digital tools that can attract the image and increase...
Assessment and Comparison of Fuzzy Based Test Suite Prioritization Method for GUI Based Software
The testing of event driven software has significant role to improve overall quality of software. Due to event driven nature of GUI based software many test cases are generated and it is difficult to identify test cases...
Model for Time Series Imputation based on Average of Historical Vectors, Fitting and Smoothing
This paper presents a novel model for univariate time series imputation of meteorological data based on three algorithms: The first of them AHV (Average of Historical Vectors) estimates the set of NA values from historic...
First Out First Served Algorithm for Mobile Wireless Sensor Networks
Wireless Sensor Networks (WSNs) have recently gained tremendous attention as they cover a vast range of applications requiring an important number of sensor nodes deployed in the area of interest to measure physiological...