An Elemental Analysis of Different CD-R discs
Journal Title: JOURNAL OF ADVANCES IN PHYSICS - Year 0, Vol 5, Issue 1
Abstract
In this study Proton Induced X-ray Emission (PIXE) and Rutherford Backscattering Spectrometry (RBS) as reliable and non-destructive techniques has been applied to compare thickness, major and trace elements of different brands of CD-R discs. Three elements, namely Ag, Ba, and Ti were found to be the major elements.
Authors and Affiliations
Amir Pishkoo
Keywords
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- EP ID EP653557
- DOI 10.24297/jap.v5i1.1976
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