Atomic Multiplet and Charge Transfer Effects in the Resonant Inelastic X-Ray Scattering (RIXS) Spectra at the Nickel L2,3 Edge of NiF2

Abstract

Resonant inelastic x-ray scattering (RIXS) is used to study the electronic structure of NiF2, which is the most ionic of the nickel compounds. RIXS can be viewed as a coherent two-steps process involving the absorption and the emission of x-rays. The soft x-ray absorption spectrum (XAS) at the metal L2,3 edge indicate the importance of atomic multiplet effects. RIXS spectra at L2,3 contain clearly defined emission peaks corresponding to d-excited states of Ni2+ at energies few eV below the elastic emission, which is strongly suppressed. These results are confirmed by atomic multiplet calculations using the Kramers-Heisenberg formula for RIXS processes. For larger energy losses, the emission spectra have a broad charge-transfer peak that results from the decay of hybridized Ni(3d)-F(2p) valence states. This is confirmed by comparison of the absorption and emission spectra recorded at the nickel L and fluorine K edges with F p and Ni d partial density of states using LDA + U calculations.

Authors and Affiliations

J. Jimenez-Mier, P. Olalde-Velasco, P. De La Mora, W. L. Yang

Keywords

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  • EP ID EP595769
  • DOI 10.15415/jnp.2017.51001
  • Views 197
  • Downloads 0

How To Cite

J. Jimenez-Mier, P. Olalde-Velasco, P. De La Mora, W. L. Yang (2017). Atomic Multiplet and Charge Transfer Effects in the Resonant Inelastic X-Ray Scattering (RIXS) Spectra at the Nickel L2,3 Edge of NiF2. Journal of Nuclear Physics, Material Sciences, Radiation and Applications, 5(1), 1-13. https://europub.co.uk/articles/-A-595769