Automatic test data generation for time-continuous embedded system using built-in signals
Journal Title: IOSR Journals (IOSR Journal of Computer Engineering) - Year 2019, Vol 21, Issue 1
Abstract
Nowadays, embedded systems are becoming critical applications and play important roles in modern society. Therefore, quality assurance for these types of systems has attracted many attentions in software engineering research and development community. In these systems, testing procedure needs high coverage criteria such that test data cover all possible run. However, it is difficult to generate test data to coverage all possible runs due to the complex embedded system. In this paper, we propose a method to automatically generate test data based on built-in source signal in order to obtain test suite with high coverage. The experimental show that the proposed method generates a better test data than that of random test and Matlab/MBT test tool.
Authors and Affiliations
Do ThiBich Ngoc, Nguyen ThiAnh Phuong
Keywords
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- EP ID EP434820
- DOI 10.9790/0661-2101012631.
- Views 111
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