Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor Films
Journal Title: Фізика і хімія твердого тіла - Year 2018, Vol 19, Issue 4
Abstract
A method for measuring the electrical conductivity and photoconductivity of semiconductor films with high electrical resistance is described. An electric circuit is presented and a computer program is developed. That provides automation of measurements, registration and initial processing of data, the possibility of constructing timelines graphs for preliminary analysis of experimental data already in the process of measurement.
Authors and Affiliations
B. S. Dzundza, V. V. Prokopiv, Т. М. Mazur, L. D. Yurchyshyn
Keywords
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- EP ID EP500836
- DOI 10.15330/pcss.19.4.363-367
- Views 68
- Downloads 0
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