Baysian Imaging Concepts for Smart Fracture Detection in X-Ray Images

Abstract

X-ray imaging is a traditional method for detecting fracture for ages. This project paves way for enhancement rather than replacement of the existing technology. It is a step towards thinking beyond digitization of X-ray. This main objective is to provide a better enhanced methodology for reconstructing X-ray images. This is done by incorporating the Bayesian concept of image processing into it. The X-ray is obtained as a running video, decoded, digitized and fed into the processing element. The Very Long Instruction Word (VLIW) architecture supporting high speed DSP core TMS320C6455 is used to perform the image enhancement algorithm. The processed image with higher degree of clarity is thus obtained with a good PSNR value. This reconstructed image can then be directed to the display device (LCD Monitor), through a LCD display driver interfaced with the processor. This device also has the potential to take the form of a portable handheld device with certain transformations made to it.

Authors and Affiliations

Dr. R. Harikumar| Professor, Department of ECE, Bannari Amman Institute of Technology, Sathyamangalam, India, B. Vinoth Kumar| Assistant Professor (Sr Gr), EEE, Bannari Amman Institute of Technology, Sathyamangalam, India, K. Karthik| UG Student, ECE, Bannari Amman Institute of Technology, Sathyamangalam, India, C. Navin Kumar| UG Student, ECE, Bannari Amman Institute of Technology, Sathyamangalam, India, Jagdsh L. K. Chand| UG Student, ECE, Bannari Amman Institute of Technology, Sathyamangalam, India

Keywords

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  • EP ID EP8334
  • DOI -
  • Views 386
  • Downloads 24

How To Cite

Dr. R. Harikumar, B. Vinoth Kumar, K. Karthik, C. Navin Kumar, Jagdsh L. K. Chand (2013). Baysian Imaging Concepts for Smart Fracture Detection in X-Ray Images. International Journal of Electronics Communication and Computer Technology, 3(1), 347-351. https://europub.co.uk/articles/-A-8334