BISR SCHEME USING BENCH MARK TESTING SEQUENTIAL CIRCUIT S27

Journal Title: GRD Journal for Engineering - Year 2016, Vol 1, Issue 0

Abstract

In this bench mark testing sequential circuit S27 is tested by using Built in Self Repair concept. This paper describes an on-chip test generation method for functional broadside tests. The hardware is based on the application of primary input sequences initial from a well-known reachable state, therefore using the circuit to produce additional reachable states. Random primary enter sequences are changed to avoid repeated synchronization and thus differed various sets of reachable states. Functional broadside tests are two-pattern scan based tests that avoid over testing by ensuring a circuit that traverses only reachable states in the functional clock cycles for a check. This consist of the input vectors and the equivalent responses. They check the proper operation of a verified design by testing the internal chip nodes. This test is useful to cover a very high percentage of modeled faults in logic circuits and their generation is the main topic of this method. Often, functional vectors are understood as verification vectors, these are used to verify whether the hardware actually matches its specification. Though, in the ATE world, any one vectors applied are understood to be functional fault coverage vectors applied during developing test, then the fault coverage area easily detected. This paper shows S27 circuit is used in Multiplier Circuit for Testing Application and it is done by Verilog Programming and simulated by Modalism 6.5version and Synthesis by Xilinx Tool

Authors and Affiliations

R. N. Nivethitha, Dr. A. Kaleel Rahuman

Keywords

Related Articles

Approaches and Challenges in Investigation of Cement Paste Characteristics

Concrete is a widely used man-made complex material in the construction industry. Fresh properties of concrete have a tremendous effect on the durability and quality of structures. The workability is the crucial fresh pr...

A Study on the Effect of Societal Advertisements on Middle Class Group in Pune City

Advertising has persuasive and powerful influence on society. It is also called a social process. It contributes substantially to social marketing. Both the profit and not-for-profit making organizations have been found...

Analysis of Energy Distribution in Sinker EDM Process

Electro Discharge Machining (EDM) is used for machining electrically conducting /semi conducting, tough and brittle material .This process is best suited for making intricate cavities and contour, dies, section of comple...

Numerical Study of Natural Ventilation in BIPV Trombe Wall

To reduce energy consumption in buildings, passive solutions have been developed greatly like increasing the insulation of exterior walls. One way to improve the energy efficiency of buildings is to design multi-function...

Self-Tuning Fuzzy PID Design for BLDC Speed Control

Brushless DC motor is an electrical motor has high efficiency and torque, long life, cheap maintenance, but it is a nonlinear so complicated in controlling its speed. The popular control system used is PID control. Many...

Download PDF file
  • EP ID EP303137
  • DOI -
  • Views 104
  • Downloads 0

How To Cite

R. N. Nivethitha, Dr. A. Kaleel Rahuman (2016). BISR SCHEME USING BENCH MARK TESTING SEQUENTIAL CIRCUIT S27. GRD Journal for Engineering, 1(0), 507-513. https://europub.co.uk/articles/-A-303137