Call for papers IMTC'2007
Journal Title: Metrology and Measurement Systems - Year 2006, Vol 13, Issue 3
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- EP ID EP123846
- DOI -
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REVIEW OF THE BOOK: WALDEMAR NAWROCKI, INTRODUCTION TO<br /> QUANTUM METROLOGY (IN POLISH)
Quantum metrology is a field of theoretical and experimental study of high-resolution and high-precision methods of measurement of physical parameters based on quantum mechanics, and particularly exploiting quantum entan...
EVALUATION OF CMM FOR FLATNESS MEASUREMENTS
Coordinate measuring machine (CMM) is a universal measuring instrument in dimensional metrology. However, the CMM has many sources of errors and deviations that affect its precision and accuracy. Unfortunately, the accur...
PERIODICALLY VARIABLE TWO-TERMINAL IMPEDANCE DESCRIPTION AND MEASURING METHODS
The subject of this paper is the problem how to describe and measure impedance of a linear periodically time-varying (LPTV) two-terminal. If the two-terminal parameters change synchronously to the supply the two-terminal...
MODELS OF BIAS OF MEAN SQUARE VALUE DIGITAL ESTIMATOR FOR SELECTED DETERMINISTIC AND RANDOM SIGNALS
The article presents the probability density functions as well as characteristic functions of selected periodic and random signals. On their basis, original models of the bias of the mean square value digital estimator...
NEW INSTRUMENTS TO MEASURE PARAMETERS OF INFRA-LOW FREQUENCY VOLTAGE SIGNALS<br />
The paper presents the design, the principles of operation and the technical specification of two types of infra-low frequency voltage instruments: the integrating converter instrument and the microprocessor instrument....