DEFINING MALFUNCTIONS OF SEMICONDUCTOR CONVERTERS’ ELEMENTS
Journal Title: Вчені записки Таврійського національного університету імені В. І. Вернадського. Серія: Технічні науки - Year 2018, Vol 29, Issue 5
Abstract
Providing fault-free equipment with semiconductor converters operation requires solution of timely identification of semiconductor converters’ elements malfunctions. The method for defining DC-DC converter’s malfunctions with quasi-impedance link, which are caused by elements’ parameters deviation out of the allowed limit. The method is based on converter’s operation modeling in normal mode and during various malfunctions and further processing of received data. The malfunction type identification is performed on the basis of the average values based on the data on the rectified voltage in the steady state and the time of the transient process, obtained during the simulation of the converter operation in normal state and in case of various malfunction. The problem of defining fault-free operation area during simultaneous change of layout’s parameters is reviewed.
Authors and Affiliations
Т. О. Терещенко, Т. А. Хижняк, Л. Г. Лайкова, М. Ю. Овсієнко, Д. С. Заруба
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