Effective Estimation of Peak-Power for a Testable Digital Circuit
Journal Title: International Journal of Advanced Research in Computer Engineering & Technology(IJARCET) - Year 2012, Vol 1, Issue 7
Abstract
Peak power corresponds to the highest value of instantaneous power measured during testing. The peak power generally determines the thermal and electrical limits of the circuit and the system packaging requirements. High peak power in only one clock cycle can be an issue if it results in a significant ground bounce or an IR-drop phenomenon that causes a memory element to lose its state and the test procedure to unnecessarily fail. Tools for evaluating the worst-case peak-power consumption of sequential circuits are strongly required by designers of low-power circuits. Previously proposed methods search for the initial state and the couple of vectors with maximum consumption, without exploiting the information on the reachable state set during the power estimation process. This paper shows that this can lead to significant underestimation of the maximum power consumption, and proposes an algorithm for overcoming this drawback.
Authors and Affiliations
M. Radha Ran , G. Rajesh Kumar , A. Karna Rao
Keywords
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