Engineering of refraction index profile of planar metal-dielectric waveguide
Journal Title: Вісник НТУУ КПІ. Серія Радіотехніка, Радіоапаратобудування - Year 2010, Vol 0, Issue 40
Abstract
Engineering of refraction index profile for planar metal-dielectric waveguide is performed.
Authors and Affiliations
V. Levandovskyy
Keywords
Related Articles
- EP ID EP309502
- DOI 10.20535/RADAP.2010.40.108-112
- Views 53
- Downloads 0
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