ESTIMATION OF CORRELATION OF FILM THICKNESS AND MAGNETIC DOMAIN STRUCTURES OF NIFE THIN FILMS
Journal Title: Proceedings of Electrotechnical Institute Prace Instytutu Elektrotechniki - Year 2012, Vol 59, Issue 259
Abstract
NiFe alloy thin films are commonly used in the area of memory devices for computers, magnetic recording media, sensor industry and microelectromechanical systems. In particular, Permalloy (Ni83Fe17) is well known group of thin films, because of its high magnetic saturation, low coercivity and low magnetization. One of the methods of providing high quality soft magnetic thin films is magnetron sputtering. Physical and electrical properties of thin films strongly depend on many parameters such as crystallographic structure, orientation, composition or the type of substrate. In addition, in the case of magnetic layers, their magnetic properties are determined by obtaining domain structure. In the article we’ve described results of the research aimed on recognition of correlation of film thickness and magnetic domain structures. In order to obtain quantitative description of obtained results, we’ve successfully applied algorithms designed for topography parameters determination.
Authors and Affiliations
Mariusz OZIMEK, Andrzej SIKORA, Wiesław WILCZYŃSKI
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