Evaluating the Effectiveness of Detecting Small Delay Defects Using Signature Analysis Technique and Scan Design
Journal Title: International Journal for Research in Applied Science and Engineering Technology (IJRASET) - Year 2015, Vol 3, Issue 10
Abstract
This paper presents a delay measurement technique using signature analysis, and a scan design for the proposed delay measurement technique to detect small-delay defects. The proposed measurement technique measures the delay of the explicitly sensitized paths with the resolution of the on-chip variable clock generator(VCG). The proposed scan design realizes complete on-chip delay measurement in short measurement time using the proposed delay measurement technique and extra latches for storing the test vectors. The evaluation with Rohm 0.18- m process shows that the measurement time is 67.8% reduced compared with that of standard delay scan design on average. The area overhead is 23.4% larger than that of the delay measurement architecture using standard scan design, and the difference of the area overhead between enhanced scan design and the proposed method is 7.4% on average. The data volume is 2.2 times of that of test set for normal testing on average.
Authors and Affiliations
Kotapati Saini, G. Suseelamma, P. Bala Murali Krishna
Keywords
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- EP ID EP21295
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