EXPERIMENTAL STUDIES OF PHOTON ABSORPTION IN SILICON AND NIOBIUM
Journal Title: Journal of Science And Arts - Year 2013, Vol 25, Issue 4
Abstract
The absorpt ion of photon through silicon and niobium is measured by using Si(Li) X - ray detector. We use Fe[sup]55[/sup] radioactive source to produce fluorescence lines from Si, Cl and Ti. The experimental results show that the absorption strongly depends on the energy of the i ncoming photon, material thickness and the atomic number of the absorber. The photon fraction absorbed is consistent when Nb and Si are placed together as an absorbing material and when they are placed one by one and resulting fraction is added. The experi mental results agree well with the calculated values of the photons fraction absorbed at five different energies.
Authors and Affiliations
SAFDAR ALI, GHULAM NABI
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