Face Recognition with SIFT Algorithm for Attendance Monitoring
Journal Title: International Journal for Research in Applied Science and Engineering Technology (IJRASET) - Year 2016, Vol 4, Issue 4
Abstract
The Face Recognition is an integral part of biometrics. In biometrics, basic traits of human are used to extract information and use that information and data for other application. The SIFT [1] algorithm takes a cropped face image and transforms it into a collection of local feature vectors. Each of these feature vectors is supposed to be distinctive and invariant to any scaling, rotation or translation of the image. In the original implementation, these features can be used to find distinctive objects in different images and the transform can be extended to match faces in images. This report describes our own implementation of the SIFT [1] algorithm and highlights potential direction for future research.
Authors and Affiliations
Om Patil, Shubham Patil, Pranav Joshi, Jayashri Joshi
Keywords
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