GENETIC VARIABILITY FOR YIELD PARAMETERS AND SPOT BLOTCH RESISTANCE IN F2 POPULATION OF DURUM WHEAT (Triticum turgidum var durum)

Journal Title: International Journal of Agriculture Sciences - Year 2017, Vol 9, Issue 7

Abstract

The experiment was conducted to study the extent of genetic variability for grain yield, its component traits and spot blotch in F2 population of the cross Bijaga yellowx NIDW-295. High phenotypic coefficient of variation (PCV) and genotypic coefficient of variation (GCV) were observed for all the characters except for days to fifty percent flowering, spike length and number of spikelet’s per spike. High heritability and genetic advance were recorded for all the characters except days to fifty percent flowering, awn length, spike length, number of spikelet’s per spike, thousand grain weight and seed yield per plant. These results suggested that better scope for selecting superior transgressive segregants in this population. For spot blotch incidence, high genetic coefficients of variation along with high heritability and genetic advance were recorded indicating the greater effectiveness of selection and improvement can be expected for spot blotch resistance. Present investigation suggests that selection in F2 population of Bijaga yellowx NIDW-295 will be effective in selecting superior plants for yield parameters and spot blotch resistance in evolving high yielding disease resistant genotype in wheat.

Authors and Affiliations

C. K. CHETHANA

Keywords

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  • EP ID EP170275
  • DOI -
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How To Cite

C. K. CHETHANA (2017). GENETIC VARIABILITY FOR YIELD PARAMETERS AND SPOT BLOTCH RESISTANCE IN F2 POPULATION OF DURUM WHEAT (Triticum turgidum var durum). International Journal of Agriculture Sciences, 9(7), 3843-3845. https://europub.co.uk/articles/-A-170275