Growth Mode Study of MgCl2 on Ti (0001) and SiO2 under Ultra High Vacuum by XPS

Journal Title: Engineering, Technology & Applied Science Research - Year 2012, Vol 2, Issue 6

Abstract

The growth mode of MgCl2 on Ti (0001) and on SiO2 grown on Si (100) was investigated by X-ray Photoelectron Spectroscopy (XPS) under UHV conditions. Magnesium chloride grows on both Ti (0001) single crystal and SiO2 following the Frank-van der Merve, (FM) growth mode.

Authors and Affiliations

S. Karakalos

Keywords

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  • EP ID EP88738
  • DOI -
  • Views 288
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How To Cite

S. Karakalos (2012). Growth Mode Study of MgCl2 on Ti (0001) and SiO2 under Ultra High Vacuum by XPS. Engineering, Technology & Applied Science Research, 2(6), -. https://europub.co.uk/articles/-A-88738