High quality CdZnTe epitaxial films: growth and properties
Journal Title: Вісник Житомирського державного технологічного університету. Серія: Технічні науки - Year 2018, Vol 81, Issue 1
Abstract
High-quality CdZnTe films of different compositions were obtained by liquid phase epitaxy. Growth occurred at low temperatures (500–530º C) from the tellurium solution. The growth kinetic of epitaxial films is analyzed. The properties of grown films by the methods of optical microscopy, X-ray diffractometry, Auger spectroscopy, and low-temperature photoluminescence are studied. The dependence of the microhardness on the composition of the resulting films is presented for the first time.
Authors and Affiliations
L. V. Rashkovetskyi, S. V. Plyatsko, P. P. Moskvin, V. L. Dobryakov, G. V. Skyba
Keywords
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