Investigation on the micro structural and surface morphological properties of SILAR grown CdO thin films by altering dipping cycle

Abstract

Cadmium oxide (CdO) thin films were prepared by successive ionic layer adsorption and reaction (SILAR) method by altering dipping cycle. The prepared films were annealed at 2500C for 2 h. The prepared films were characterized by X-ray diffraction (XRD), optical spectroscopy and scanning electron microscopy (SEM) measurement. The XRD analysis reveals that the films were polycrystalline with cubic structure. Both crystallinity and the grain size were found to increase with increasing dipping. SEM analysis shows the porous nature of the surface with spherical nano clusters. Energy dispersive spectroscopic analysis (EDX) confirmed the presence of Cd and O elements.

Authors and Affiliations

M. Karunakaran, M. Rajini, S. Maheswari, K. Kasirajan, S. Dineshraj

Keywords

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  • EP ID EP22662
  • DOI -
  • Views 237
  • Downloads 5

How To Cite

M. Karunakaran, M. Rajini, S. Maheswari, K. Kasirajan, S. Dineshraj (2016). Investigation on the micro structural and surface morphological properties of SILAR grown CdO thin films by altering dipping cycle. International Journal for Research in Applied Science and Engineering Technology (IJRASET), 4(9), -. https://europub.co.uk/articles/-A-22662