Magnetic Force Microscopy for Nanoparticle Characterization
Journal Title: NanoWorld Journal - Year 2016, Vol 2, Issue 1
Abstract
Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a member of a growing family of scanning probe methods and has been widely used for the study of magnetic materials. In MFM a magnetic probe is used to raster-scan the surface of the sample, of which its magnetic field interacts with the magnetic tip to offer insight into its magnetic properties. This review will focus on the use of MFM in relation to nanoparticle characterization, including superparamagnetic iron oxide nanoparticles, covering MFM imaging in air and in liquid environments.
Authors and Affiliations
Gustavo Cordova, Brenda Yasie Lee, Zoya Leonenko
Keywords
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- EP ID EP223278
- DOI 10.17756/nwj.2016-022
- Views 99
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