Magnetic force microscopy using fabricated cobalt-coated carbon nanotubes probes

Journal Title: Iranian Chemical Communication - Year 2015, Vol 3, Issue 3

Abstract

Magnetic force microscope ( MFM ) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope ( AFM ) tip was investigated . The optimum voltage and frequency of SWCNT solution are obtained as 13 volts and 2 MHz, respectively. After coating theas-prepared CNT tips with a layer of cobalt,it can be used to obtain high resolution MFM images.

Authors and Affiliations

Jamal Afzali, Sedigheh Sadegh Hassani

Keywords

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  • EP ID EP259183
  • DOI -
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How To Cite

Jamal Afzali, Sedigheh Sadegh Hassani (2015). Magnetic force microscopy using fabricated cobalt-coated carbon nanotubes probes. Iranian Chemical Communication, 3(3), 266-275. https://europub.co.uk/articles/-A-259183