MANUFACTURING PLANNING AND CONTROL SYSTEM USING TOMOGRAPHIC SENSORS
Journal Title: Informatyka Automatyka Pomiary w Gospodarce i Ochronie Środowiska - Year 2018, Vol 8, Issue 3
Abstract
The article presents an idea of a production process control system. Advanced automation and control of production processes play a key role in maintaining competitiveness. The proposed solution consists of sensor networks for measurement process parameters, production resources and equipment state. The system uses wired and wireless communication, which gives possibility to acquisition data from existing in enterprise sensors and systems as well as acquisition data from new systems and sensors used to measure all processes, starting from production preparation to the final product. The solution contains process tomography sensors based on electrical capacitance tomography, electrical impedance tomography and ultrasound tomography. The use of tomographic methods enables to manage the intelligent structure of the companies in terms of processes and products. Industrial tomography enables observation of physical and chemical phenomena without the need to penetrate inside. It will enable the optimization and auto-optimization of design processes and production. Such solutions can operate autonomously, monitor and control measurements. All sensors return to the system continuous data about state of processes in some technologically closed objects like fermenters. Process tomography can also be used to acquisition data about a flow of liquids and loose ingredients in pipeline based on transport systems. Data acquired from sensors are collected in data warehouses in order to future processing and building the knowledge base. The results of the data analysis are showed in user control panels and are used directly in the control of the production process to increase the efficiency and quality of the products. Control methods cover issues related to the processing of data obtained from various sensors located at nodes. Monitoring takes place within the scope of acquired and processed data and parameter automation.<br/><br/>
Authors and Affiliations
Jonrad Niderla, Tomasz Rymarczyk, Jan Sikora
Keywords
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- DOI 10.5604/01.3001.0012.5280
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