МЕТРОЛОГІЧНЕ ЗАБЕЗПЕЧЕННЯ АЦП, ОСНАЩЕНИХ ПІДСИСТЕМОЮ МЕТРОЛОГІЧНОЇ САМОПЕРЕВІРКИ
Journal Title: Вимірювальна техніка та метрологія - Year 2012, Vol 1, Issue 73
Abstract
There is formulated the problem of traceability of analog to digital conversion results in the condition of large-scale implementation of analog to digital converters (ADC). It is proposed the method of solving this problem by embedding the metrology testing subsystem into ADC, which is based on measurement the nonlinear component of systematic error of ADC. There is proposed the structure of such subsystem for eight-range ADC. Also there is formulated the approach of error evaluation of analog to digital conversion results by self testing results.
Authors and Affiliations
Роман Кочан
ПОХИБКИ ПРОГНОЗУВАННЯ ЗНАЧЕННЯ ТЕМПЕРАТУРИ НЕЙРОННИМИ МЕРЕЖАМИ ЗА ІДЕАЛЬНИМ ПЕРЕХІДНИМ ПРОЦЕСОМ
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