A Survey of Recursive Pseudo-Exhaustive Two-Pattern Generation Using BIST

Abstract

 Pseudo-exhaustive pattern generators for built-in self-test (BIST) provide high fault coverage of detectable combinational faults with much fewer test vectors than exhaustive generation. In -adjacent bit pseudo-exhaustive test sets, all binary combinations appear to all adjacent -bit groups of inputs. With recursive pseudoexhaustive generation, all -adjacent bit pseudoexhaustive tests are generated for and more than one modules can be pseudo-exhaustively tested in parallel. In order to detect sequential (e.g., stuck-open) faults that occur into current CMOS circuits, two-pattern tests are exercised. Also, delay testing, commonly used to assure correct circuit operation at clock speed requires two-pattern tests. In this paper a pseudoexhaustive two-pattern generator is presented, that recursively generates all two-pattern -adjacent bit pseudoexhaustive tests for all . To the best of our knowledge, this is the first time in the open literature that the subject of recursive pseudoexhaustive two-pattern testing is being dealt with. A software-based implementation with no hardware overhead is also presented. I

Authors and Affiliations

B. Kamalasoundari M. E. ,

Keywords

Related Articles

IMPACT OF BRAND LOYALTY ON RETAIL BUYING BEHAVIOUR IN HYDERABAD

Brand loyalty is the consumer’s emotionally -charged decision to purchase a specific brand again and again. Recent studies focused on loyalty concept in goods as well as services sector. Of late brand loyalty is receivi...

 A Review on Current Scenario in the Field of Nanorobotics

 This paper focusses on the contemporary development of nano-robotics by describing various design models, potential applications and associated issues. Nanorobots are devices at nano (10-9) meters that are compos...

 Design and Development of Automated Faucet Valve Regulating Mechanism

 As the population in our world is increasing alarmingly there arise numerous problems pertaining to the survival of human beings. One major problem being water scarcity. The main reason behind this being increased...

COMPUTERIZED COURSE RESULT GRADE SHEET LAYOUT UPGRADE

Result computation occupies an important space in the running of a border university administration as it brings to culmination the exercise for the products' output for which the University is instituted. This paper del...

 An Key Frame Extraction using Euler Distance

 Key frame extraction has been recognized as one of the important research issues in video information .Although progress has been made in key frame Extraction the existing approaches are either computationally ex...

Download PDF file
  • EP ID EP95483
  • DOI -
  • Views 85
  • Downloads 0

How To Cite

B. Kamalasoundari M. E. , (30).  A Survey of Recursive Pseudo-Exhaustive Two-Pattern Generation Using BIST. International Journal of Engineering Sciences & Research Technology, 3(2), 1072-1082. https://europub.co.uk/articles/-A-95483