A Survey of Recursive Pseudo-Exhaustive Two-Pattern Generation Using BIST
Journal Title: International Journal of Engineering Sciences & Research Technology - Year 30, Vol 3, Issue 2
Abstract
Pseudo-exhaustive pattern generators for built-in self-test (BIST) provide high fault coverage of detectable combinational faults with much fewer test vectors than exhaustive generation. In -adjacent bit pseudo-exhaustive test sets, all binary combinations appear to all adjacent -bit groups of inputs. With recursive pseudoexhaustive generation, all -adjacent bit pseudoexhaustive tests are generated for and more than one modules can be pseudo-exhaustively tested in parallel. In order to detect sequential (e.g., stuck-open) faults that occur into current CMOS circuits, two-pattern tests are exercised. Also, delay testing, commonly used to assure correct circuit operation at clock speed requires two-pattern tests. In this paper a pseudoexhaustive two-pattern generator is presented, that recursively generates all two-pattern -adjacent bit pseudoexhaustive tests for all . To the best of our knowledge, this is the first time in the open literature that the subject of recursive pseudoexhaustive two-pattern testing is being dealt with. A software-based implementation with no hardware overhead is also presented. I
Authors and Affiliations
B. Kamalasoundari M. E. ,
Keywords
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