Deposition, Optical Characterization and Durability Tests of MgF2 Antireflection Thin Films

Journal Title: INTERNATIONAL JOURNAL OF ENGINEERING TRENDS AND TECHNOLOGY - Year 2013, Vol 4, Issue 8

Abstract

 In this study, structural and optical properties of MgF2 thin films produced by physical vapour deposition technique on the BK7 glass substrate have been investigated. Deposited films were annealed at different temperatures. Crystallinity in the material is confirmed by X-ray diffraction technique. Microstructure of the films shown uniform grain morphology. The optical properties have been investigated by using UV/VIS /NIR spectrophotometer. The optical constants of the films are in good agreement with the literature data of bulk MgF2. The durability of the coating has been systematically investigated by different treatments.

Authors and Affiliations

V. Atchaiah Naidu1* , G. Laxmi Narayana2 , V. Rajashekar Reddy1 , M. B. Suresh3 , I. M. Chhbra2 , P. Kistaiah

Keywords

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  • EP ID EP146652
  • DOI -
  • Views 96
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How To Cite

V. Atchaiah Naidu1*, G. Laxmi Narayana2, V. Rajashekar Reddy1, M. B. Suresh3, I. M. Chhbra2, P. Kistaiah (2013).  Deposition, Optical Characterization and Durability Tests of MgF2 Antireflection Thin Films. INTERNATIONAL JOURNAL OF ENGINEERING TRENDS AND TECHNOLOGY, 4(8), 3559-3562. https://europub.co.uk/articles/-A-146652