ELECTRIC CHARGES ON PHOSPHOR PARTICLES DETERMINE FEATURES OF LIGHTED FL TUBES
Journal Title: International Journal of Engineering Sciences & Research Technology - Year 0, Vol 4, Issue 9
Abstract
The lighting devices such as coil-EEFL tube, HCFL tube, PDP and flat fluorescent lamp (FFL) use the opaque phosphor screen as the transducer from the UV lights to the visible lights. The phosphor screens as the transducer of the UV lights have already optimized. The lighting mechanisms in the inside of the FL tube are invisible by the naked eyes. The lights in the lighting devices originate from the excitation of the floating Hg atoms by the moving electrons in the positive column which is defined as the Vvect ≥ Fphos in the Ar gas space. The Fphos on the phosphor screen in the FL tubes ever report in the past. The surfaces of the phosphor particles in the screens are deliberately contaminated by the impurities of the electric insulators. The impurities on the phosphor particles in the lighted FL tubes form the surface bound electrons (SBE), giving rise to the depth of the gap of 4 x 10-3 m (= 4 mm), independent on the diameters of the FL tubes. The deep gap severely restricts the illuminance of the lighted FL tubes. The lighted low voltage CL phosphor particles do not have the SBE, but the electrons selectively move on the surface conduction on the phosphor screen in the FL tubes. We have obtained the fundamental data of the formation mechanisms by the Vvect ≥ Fphos and of the reduction of the depths of the gap to 1 x 10-4 m. The optimal arrangements of the phosphor particles in the phosphor screen of the coil-EEFL tubes are underway.
Authors and Affiliations
Lyuji Ozawa*
Keywords
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