INVESTIGATION OF VOLTAMPERE CHARACTERISTICS OF DIODIC STRUCTURE ON BASE OF THIN FILMS OF RHENIUM CHALCOGENIDES
Journal Title: International Journal of Engineering Sciences & Research Technology - Year 30, Vol 5, Issue 3
Abstract
Were investigated electro-physical properties of thin layers of rhenium chalcogenides’ alloys, their dynamical and static volt-ampere characteristics During the investigation of static and dynamical ampere-voltaic characteristics of rectifying contact of aluminium and rhenium chalcogenides’ alloys the switching effects were found. The studying of the data got at present work shows the structure based on alloy of rhenium with chalcogenides AVC with S- and N sections of NR with straight and reverse current directions.
Authors and Affiliations
E. A. Salakhova,
Keywords
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- EP ID EP128186
- DOI 10.5281/zenodo.48358
- Views 54
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