Preparation and Thickness Measurement of Cux Zn1-x S Nanocomposite Thin Film by SILAR Method
Journal Title: IOSR Journal of Applied Physics (IOSR-JAP) - Year 2018, Vol 10, Issue 5
Abstract
Thin film are of particular interest for fabrication of large area arise like solar cells, photo conductors, photo thermal solar coding etc, and it can be prepared by various techniques such as sputtering, CVD, CBD etc. In the present study Cux Zn1-xS nanocomposite thin films were prepared by Successive Ionic Layer Adsorption and Reaction (SILAR) method for various value of x viz 0.2, 0.4, 0.6 and 0.8. The prepared films were characterized by EDS and PXRD. The composition of the nanocomposite was estimated from the EDS data and the particle size was determined by PXRD data. The thickness of the film was calculated from weight method. The EDS and PXRD data shows that the film prepared in the present study are nanocomposites.
Authors and Affiliations
2Dr. N. Neelakandapillai
Keywords
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