PROBE CAPACITANCE-DEPENDENT SYSTEMATIC ERROR IN I-V MEASUREMENTS OF NANOWIRES: ANALYSIS AND CORRECTION<br />
Journal Title: Metrology and Measurement Systems - Year 2007, Vol 14, Issue 3
Abstract
We propose a method of eliminating the systematic error due to the capacitance of digital oscilloscope probes in the experimental setup used for tracing current-voltage (I-V) curves of nanowires with quantum point contact (QPC). Used in I-V measurements, a digital storage oscilloscope (DSO) allows a reduction of measurement time to microseconds. Such short measurement time, however, involves a sensible effect of transition states occurring in an experimental setup representing an RC circuit. We analyze the effect of probe capacitance on the signal reading and on the resulting I-V curves, and derive theoretical formulae for the probe capacitance-dependent systematic error on the basis of a model proposed for the discussed measurement method. The systematic error is evidenced by nonlinearity of the obtained current-voltage curve, its shift with respect to the origin of the coordinate system, and an extension of the measurement range. We propose a correction method based on the derived theoretical relations that allow to calculate the corrections to be applied. The presented results of I-V measurements of nanowires with QPC confirm the correctness of our model and the efiectiveness of the method proposed.
Authors and Affiliations
MACIEJ WAWRZYNIAK
Keywords
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