Process Variation Induced Mismatch Analysis In Sense Amplifiers

Abstract

Sense amplifier is a very critical peripheral circuit in memories as its performance strongly affects both memory access time, and overall memory power dissipation. As the device dimensions scale below 100nm, the process variations are increasing and are impacting the circuit design significantly. In this paper, effects of process variation induced transistor mismatch on sense amplifier performance are studied. A comparative study of the effect of mismatch on delay for different sense amplifier configurations at 45nm technology is presented.

Authors and Affiliations

Parita Patel, Sameena Zafar,and Hemant soni

Keywords

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  • EP ID EP27925
  • DOI -
  • Views 266
  • Downloads 0

How To Cite

Parita Patel, Sameena Zafar, and Hemant soni (2014). Process Variation Induced Mismatch Analysis In Sense Amplifiers. International Journal of Research in Computer and Communication Technology, 3(4), -. https://europub.co.uk/articles/-A-27925