Scanning Electron Microscopy (SEM) of Multilayer CdS Thin Films
Journal Title: International Journal for Research in Applied Science and Engineering Technology (IJRASET) - Year 2014, Vol 2, Issue 10
Abstract
The first thin solid films were obtained by electrolysis in 1864, B White Bunsen and Grover obtained metallic film in the year 1852, by thermal evaporation on explosion of a current carrying metal wire. The usefulness of optical properties of metal films and scientific curiosity about the behavior of two dimensional solid have been responsible for the immense interest in the study of the science and technology of thin films. In this paper we shall study the SEM of multilayer CdS thin film.
Authors and Affiliations
Vishal Kumar Sharma, Mahendra Kumar
Keywords
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