Scanning Electron Microscopy (SEM) of Multilayer CdS Thin Films

Abstract

The first thin solid films were obtained by electrolysis in 1864, B White Bunsen and Grover obtained metallic film in the year 1852, by thermal evaporation on explosion of a current carrying metal wire. The usefulness of optical properties of metal films and scientific curiosity about the behavior of two dimensional solid have been responsible for the immense interest in the study of the science and technology of thin films. In this paper we shall study the SEM of multilayer CdS thin film.

Authors and Affiliations

Vishal Kumar Sharma, Mahendra Kumar

Keywords

Related Articles

Virtual Manufacturing and Their Application

The present paper gives the survey of Virtual Manufacturing, through this paper an attempt has been made to visualize the recent developments and innovations and researches to implement the Virtual Manufacturing techniq...

Java Security

The Java platform provides a number of features designed to improve the security of Java applications Java's security model is one of the language's key architectural features that makes it an appropriate technology for...

Thermal comfort increase using up cycled PET bottles shutters technology

An appropriate technology based on up-cycled PET water bottles utilization is presented. The bottles constitute the main constructive element of a shutters system. The most relevant expected application is to meliorate...

An Implementation of Cluster Head Algorithm with ACO and Leach Protocol in WSN for Transferring the Data

A wireless network is any type of computer network that uses wireless data connections for connecting network nodes. Wireless networking is a method by which homes, telecommunications networks and enterprise (business)...

A Review Paper on Currency Recognition System

There are many type of currencies in the world, with each of them looking different with their features i.e. differ in the size of the banknotes, color, texture etc. the people who work in the money exchange have to dif...

Download PDF file
  • EP ID EP18998
  • DOI -
  • Views 276
  • Downloads 10

How To Cite

Vishal Kumar Sharma, Mahendra Kumar (2014). Scanning Electron Microscopy (SEM) of Multilayer CdS Thin Films. International Journal for Research in Applied Science and Engineering Technology (IJRASET), 2(10), -. https://europub.co.uk/articles/-A-18998