Scanning Electron Microscopy (SEM) of Multilayer ZnS Thin Films

Abstract

Conducting polymers have emerged as a very important class of materials because of their unique electrical, optical and chemical properties leading to the wide range of technological applications. In this paper we shall study the SEM of multilayer ZnS thin film.

Authors and Affiliations

Vishal Kumar Sharma, Mahendra Kumar

Keywords

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  • EP ID EP19479
  • DOI -
  • Views 270
  • Downloads 4

How To Cite

Vishal Kumar Sharma, Mahendra Kumar (2015). Scanning Electron Microscopy (SEM) of Multilayer ZnS Thin Films. International Journal for Research in Applied Science and Engineering Technology (IJRASET), 3(1), -. https://europub.co.uk/articles/-A-19479