Scanning Electron Microscopy (SEM) of Multilayer ZnS Thin Films

Abstract

Conducting polymers have emerged as a very important class of materials because of their unique electrical, optical and chemical properties leading to the wide range of technological applications. In this paper we shall study the SEM of multilayer ZnS thin film.

Authors and Affiliations

Vishal Kumar Sharma, Mahendra Kumar

Keywords

Related Articles

Multiservice Product Comparison System

Big-data computing is a new critical challenge for the ICT industry. Engineers and researchers are dealing with data sets of petabyte scale. Conventional way to provide comparison between products from heterogenous webs...

A Literature Review on Cycle Time Reduction in Material Handling System by Value Stream Mapping

Cycle time should be considered as a viable option when an organization is trying to improve efficiency, cost base and customer responsive. Value stream mapping is a paper and pencil tool that helps you to see and under...

Comparison of Various Transformerless Full-bridge Topologies for Photovoltaic Grid -Tied Inverters

If there is no transformer is used in the single phase grid tied photovoltaic system, then the electrical connection live between the grid and the PV array. In this condition, the generated common mode voltage largely d...

Analysis of Telecommunication Data: Call Drop

Today, cellular phones are the most commonly used wireless technology. Cellular phones are so common that it can be seen in everyone’s hand whether it is old, young or teenagers. It is used for communication with each o...

A Review Paper on Optimization of Process Parameter of Resistance Spot Welding

Resistance spot welding is commonly used in sheet joining in the aerospace industry and automotive industry, because it has the advantage which is high-production assembly lines, high speed and suitability for automatio...

Download PDF file
  • EP ID EP19479
  • DOI -
  • Views 233
  • Downloads 4

How To Cite

Vishal Kumar Sharma, Mahendra Kumar (2015). Scanning Electron Microscopy (SEM) of Multilayer ZnS Thin Films. International Journal for Research in Applied Science and Engineering Technology (IJRASET), 3(1), -. https://europub.co.uk/articles/-A-19479