SRGM with logistic-exponential Testing-effort function with change-point and Analysis of Optimal release policies based on increasing the test efficiency

Journal Title: International Journal on Computer Science and Engineering - Year 2010, Vol 2, Issue 3

Abstract

Reliability is the one of the important factor of software quality. Past few decades several software reliability growth models are proposed to access the quality of the software. Main challenging task of reliability growth model is predicting the reliability, total cost at optimal time at, software released into the market. It has been observed that most of the reliability growth models predict the failure rate to be constant during the software testing, but in reality software failure rate changes with testing time. In this paper we have investigated software reliability growth model by incorporating the both change point and testing effort. We incorporated logistic-exponential TEF in software reliability growth model with change-point. We also investigated the how testing efficiency can be increased by adopting the new automated testing tools into the software testing and its effect on the total cost of the software. Experiments are done on real datasets. Parameters are estimated. Results show the better fit.

Authors and Affiliations

Shaik. Mohammad Rafi , Dr. K. Nageswara Rao

Keywords

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  • EP ID EP144970
  • DOI -
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How To Cite

Shaik. Mohammad Rafi, Dr. K. Nageswara Rao (2010). SRGM with logistic-exponential Testing-effort function with change-point and Analysis of Optimal release policies based on increasing the test efficiency. International Journal on Computer Science and Engineering, 2(3), 504-516. https://europub.co.uk/articles/-A-144970