Structure and temperature profile limits of optic fiber chalcogenide material based selenium
Journal Title: IOSR Journal of Electronics and Communication Engineering(IOSR-JECE) - Year 2018, Vol 13, Issue 5
Abstract
The X-ray diffraction pattern of the system Se80S20-xB where (x=0,2.5,5 and B=In or As) confirms the amorphous nature of the bulk and thin film of all samples. The addition of In or As to Se80S20 on the expense of S confirms this result.Also, the non-uniformity of SEM micrographs confirm the amorphous nature of the samples under test. The SEM micrographs of all samples after addition of In or As on the expense of S and even the addition of Er cover layer reveals no change in the amorphous structure. The thermal differential analysis (DTA) proves that the glass transition range is wide as 60oC with onset temperature 1060C for the sample Se80S20. This range becomes narrow as In or As replacing partially S. The addition of In on the expense of S reduces this range to be in the range 150C-200C. Also, replacing In by As this range becomes only one degree. The crystallization temperature (TC) of the sample Se80S20 was 2330C. The addition of In to Se80S20 on the expense of S reduced TC to be 2060C- 2110C depending on the In ratio. The replacing of In by As with the same ratio decreases TC to be 1800C and 1400C as As increases from 2.5 at % to 5 at %, respectively. The melting temperature range was 300C(5300C-5600C) for the sample Se80S20. This range decreased to be 15-200C as In replacing S partially. Finally, the thermal profile of the given chalcogenide material based selenium is a good selection to the production of optic fiber material to serve the international net communication well
Authors and Affiliations
M. M. El-zaidia, Z. H. El-Gohary, M. S. Abo Ghazala, G. M. Turky, E. A. Rabea
Keywords
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- EP ID EP439303
- DOI 10.9790/2834-1305015459.
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