Test power optimization with redundant transition test patterns in Digital Circuit
Journal Title: IOSR Journal of Electronics and Communication Engineering(IOSR-JECE) - Year 2018, Vol 13, Issue 3
Abstract
In the design modelling of a DFT interface, the controlling and access operation defines the performance of BIST interfacing. In a DFT application, data stored in the BIST units are mapped to given query input and an output is developed as a match signal to which as decision is made. in the process of DFT operation, to obtain a faster matching and low power consumption, a new search approach and pattern alignment logic is defined. To improve the storage capacity of a DFT unit, a multi page interface is proposed. To the defined unit a new fault tolerance approach is integrated for a reliable, low power and fast processing DFTapplication.
Authors and Affiliations
Y. Sreenivasula Goud, Dr. B. K. Madhavi
Keywords
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- EP ID EP439094
- DOI 10.9790/2834-1303010108.
- Views 148
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