The main characteristics of SiGe HBTs at low temperatures

Abstract

The current-voltage curves (CVC) of n-p-n SiGe heterojunction bipolar transistors (HBT) are considered within the temperature range from minus -195˚С up to 25˚С, produced on the SGB25V technology of IHP. The experimental setup, the measurement technique and the connection features of transistors for elimination of the self-excitation are described. The special attention is paid to the temperature dependences of the static base current gain βF in the common-emitter configuration (CEC) and to the output CVC characteristics of transistor in the CEC.

Authors and Affiliations

О. Dvornikov, V. Tchekhovski, N. Prokopenko

Keywords

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  • EP ID EP308273
  • DOI 10.20535/RADAP.2016.66.87-96
  • Views 58
  • Downloads 0

How To Cite

О. Dvornikov, V. Tchekhovski, N. Prokopenko (2016). The main characteristics of SiGe HBTs at low temperatures. Вісник НТУУ КПІ. Серія Радіотехніка, Радіоапаратобудування, 0(66), 87-96. https://europub.co.uk/articles/-A-308273