THERMAL ANALYSIS OF CMOS VOLTAGE-CONTROLLED OSCILLATORS

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THERMAL ANALYSIS OF CMOS VOLTAGE-CONTROLLED OSCILLATORS

Journal Title: Informatyka Automatyka Pomiary w Gospodarce i Ochronie Środowiska - Year 2012, Vol 2, Issue 4

Abstract

The paper presents impact of chip temperature on frequency generated by Voltage-Controlled Oscillators. Three different CMOS structures have been tested. Resonant cross-coupled oscillator was designed and fabricated in AMS 0.35 mm (3.3 V) technology and has at ambient temperature the frequency range from 2.2 to 2.5 MHz. Two different ring oscillators were designed in UMC 0.18 mm (1.8 V) technology and have at ambient temperature the frequency range respectively from 0.6 to 2.8 GHz and from 0.4 to 1.9 GHz. All circuits were designed using full-custom technique. Influence of temperature to tuning range and power consumption has been investigated.

Authors and Affiliations

Maciej Frankiewicz, Andrzej Kos

Keywords

VCO LC RO CMOS VCO układy rezonansowe generatory pierścieniowe CMOS

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EP ID EP59391
DOI -
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