Metrology and Measurement Systems

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Metrology and Measurement Systems

Print ISSN: 0860-8229

Electronic ISSN: None

Basic Info

Publisher: Polska Akademia Nauk,POLISH ACAD SCIENCES COMMITTEE METROLOGY & RES EQUIPMENT,Polish Academy of Sciences
Country: poland
Date added to EuroPub 2019/Sep/27

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Time from submission to publication: Weeks

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Article Processing Charges (APCs): No
Submission charges: No
Waiver policy for charges? No

Open access & licensing

Type of License:
Open Access Statement: No
Year open access content began: 1988
Does the author retain unrestricted copyright? False
Does the author retain publishing rights? False

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Impact Factor

THE INFLUENCE OF INACCURACY OF CALCULATING ALGORITHMS USED IN THE CMMS ON MEASUREMENT RESULTS -FINAL REPORT<br />

Journal title: Metrology and Measurement Systems

Authors: PAWEŁ SWORNOWSKI

Subject(s):

A MULTI-METHOD APPROACH TO MEASUREMENT OF RESPIRATORY SYSTEM MECHANICS

Journal title: Metrology and Measurement Systems

Authors: ADAM POLAK, DARIUSZ WYSOCZAŃSKI, JANUSZ MROCZKA

Subject(s):

ANTIALIASING FILTERS IN POWER QUALITY DIGITAL MEASUREMENT SYSTEMS

Journal title: Metrology and Measurement Systems

Authors: M. SZMAJDA, K. GÓRECKI, J. MROCZKA

Subject(s):

COMPARISON OF CAPACITORS BY MEANS OF A DOUBLE-CHANNEL DIGITIZER

Journal title: Metrology and Measurement Systems

Authors: DUŠAN AGREŽ

Subject(s):

HONORARY DOCTORATE FOR PROF. OSANNA

Journal title: Metrology and Measurement Systems

Authors: Stanisław Adamczak

Subject(s):

IN MEMORY OF THE PROFESSOR DR HAB. BRUNON SZADKOWSKI

Journal title: Metrology and Measurement Systems

Authors: Maria Bojarska

Subject(s):

COMPARISON OF LS-TYPE METHODS FOR DETERMINATION OF OLIVE OIL MIXTURES ON THE BASIS OF NIR SPECTRAL DATA

Journal title: Metrology and Measurement Systems

Authors: AGATA LATAŁA, ROMAN MORAWSKI

Subject(s):

FACTORS LIMITING EXTREMELY SENSITIVE MEASURING RANGES OF CONTEMPORARY PICOAMMETERS<br />

Journal title: Metrology and Measurement Systems

Authors: ZBIGNIEW KŁOS, JAROSŁAW KRYSIAK

Subject(s):

REALIZATION OF ATOMIC SI SECOND DEFINITION IN THE CONTEXT OF UTC(PL) AND TA(PL)

Journal title: Metrology and Measurement Systems

Authors: ALBIN CZUBLA, JANUSZ KONOPKA, JERZY NAWROCKI

Subject(s):

ANALYSIS OF A THREE-VOLTMETER MEASUREMENT METHOD DESIGNED FOR LOW-FREQUENCY IMPEDANCE COMPARISONS

Journal title: Metrology and Measurement Systems

Authors: ANDRZEJ MUCIEK, FRANCO CABIATI

Subject(s):

APPLICATION OF GENETIC ALGORITHM TO MEASUREMENT SYSTEM CALIBRATION INTENDED FOR DYNAMIC MEASUREMENT

Journal title: Metrology and Measurement Systems

Authors: KRZYSZTOF TOMCZYK

Subject(s):

A TRANSDUCER INTERFACE FOR RESISTIVE SENSOR ELEMENTS BASED ON THE USE OF A FLIP-FLOP<br />

Journal title: Metrology and Measurement Systems

Authors: MARTIN KOLLÁR

Subject(s):

FOUR-PARAMETER SINE-FITTING ALGORITHM FOR DETECTION AND CLASSIFICATION OF TRANSIENTS AND WAVEFORM DISTORTIONS

Journal title: Metrology and Measurement Systems

Authors: PEDRO RAMOS, TOMÁŠ RADIL, A. CRUZ SERRA

Subject(s):

ADVANCED NANOMETROLOGY TECHNIQUES OF CARBON NANOTUBES CHARACTERIZATION

Journal title: Metrology and Measurement Systems

Authors: SALAH ALI, M. ETMAN, B. AZZAM, R. RASHAD

Subject(s):

NONLINEAR CURRENT OSCILLATIONS IN A JOSEPHSON JUNCTION WITH FRACTAL RADIOISOTOPE COMPOSITES

Journal title: Metrology and Measurement Systems

Authors: S. KRUCHININ, V. NOVIKOV

Subject(s):