Joint Effect of Heterogeneous Intrinsic Noise Sources on Instability of MEMS Resonators Journal title: Elektronika Authors: Olga Jakšić, Ivana Jokić, Miloš Frantlović, Danijela Randjelović, Dragan Tanasković, Žarko Lazić, Da... Subject(s):
1/f noise study as a non-destructive test to check MOSFET Journal title: IOSR Journals (IOSR Journal of Electrical and Electronics Engineering) Authors: P. Ananda, S.Victor Vedanayakam, K. Thyagarajan, N. Vijaya Lakshmi Subject(s):
1/f noise and carrier transport mechanisms in InSb p + -n junctions Journal title: Semiconductor Physics, Quantum Electronics and Optoelectronics Authors: V.V. Tetyorkin Subject(s):
