Scan-Based Delay Measurement Technique Using Signature Registers Journal title: International Journal of Modern Engineering Research (IJMER) Authors: Telukutla Sahithi, Mr. V. Venkateswarlu Subject(s):
Power Minimisation in Scan Sequential Circuits Based On Best Primary Input Change Time Journal title: International Journal of Engineering and Science Invention Authors: Prof.Dr.G.Manoj Someswar, B.Babu Rajesh Subject(s):