Impact of Elliptical Cross-Section on Some Electrical Properties of Gate-All-Around MOSFETs Journal title: Bonfring International Journal of Power Systems and Integrated Circuits Authors: Shankaranand Jha , Ashok Kumar , Subindu Kumar Subject(s):
Analysis of the Effect of Phantom CT Scan Diameter Variations on Radiation Dose with IndoseCT Journal title: International Journal of Allied Medical Sciences and Clinical Research Authors: ntan Andriani Subject(s):
