DETERMINATION OF BARRIER HEIGHT OF NI-SEMICONDUCTOR CONTACTS BY PHOTOELECTRIC METHOD Journal title: Сенсорна електроніка і мікросистемні технології Authors: V. P. Makhniy, M. M. Berezovskiy, V. M. Sklyarchuk, A. M. Slyotov Subject(s):
The influence of the metal microstructure on the breakdown mechanism of Schottky diodes Journal title: Materials Physics and Chemistry Authors: Sh.G.Askerov, M.G.Gasanov, L.KAbdullayeva Subject(s): Chemistry, Physics, Mechanics, Materials Science, Biomaterials, Polymer Science
