“A Survey on Different Fingerprint Recognition Systems”
Journal Title: International Journal of Advanced Research in Computer Engineering & Technology(IJARCET) - Year 2013, Vol 2, Issue 2
Abstract
In this paper we are comparing various fingerprint recognition system which are based on minutiae and ridge feature extraction. Here we are comparing various methods using minutiae features only or ridge features only or using both the methods together. This paper shows the direction for future scope on advancement of fingerprint recognition system. Methods focusing on conventional minutiae features (viz. minutiae type orientation and position) and methods focusing on additional ridge features (viz. ridge count(rc), ridge length(rl), ridge curvature direction(rcd) and ridge type(rt) ) are observed and results supporting the respective methods are compared. Thus focus is emphasized on minutiae matching using ridge feature approach and future scope is discussed.All the methods used are generally minutiae based. Such systems cannot use more topological information such as ridge shape covering the entire FP image. Also the limitation of information still exists. Another drawback is that complex data structures and many parameters are used for FP matching. Thus a simple matching scheme was proposed by Heeseung et al. instead of developing complex distortion models or minutiae alignment model. Heeseung et al. incorporated conventional minutiae features and additional ridge features associated with corresponding minutiae sets. For evaluating any parameter a coordinate system proves helpful. Cartesian, cylindrical and spherical coordinate systems are used in various fields of science to measure various features. Similarly a ridgebased coordinate system is also defined to extract ridge features. Ridge count (rc), ridge length (rl), ridge curvature direction(rcd) and ridge type(rt) are the 4 elements of ridge features defined earlier. Here FPR system results will be proposed by addition of another ridge feature as ridge distance(rd)
Authors and Affiliations
Mr Parth BPathak , Prof Mrs A G Andurkar
Keywords
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