Comparative study of different Sense Amplifiers in 0.18um technology

Journal Title: INTERNATIONAL JOURNAL OF COMPUTERS & TECHNOLOGY - Year 2013, Vol 7, Issue 3

Abstract

A comparative study of different types of sense amplifiers [1] using 0.18um technology is presented. The sense amplifiers under considerations are used in SRAM and DRAM cells.The sensing delay of different types of sense amplifiers  are evaluated with respect to variation of bitline capacitance. Comparative results are also provided for the variation in delay with respect to power supply. Extensive results based on 0.18um CMOS technology using CADENCE Spectre simulation tools are presented for different architectures of sense amplifiers. From these results it has been proven that if the output of sense amplifier is isolated from the bitline parasitic capacitance then the sensing delay of sense amplifier reduces.

Authors and Affiliations

Sunil Kumar, Arun Kr. Chatterjee

Keywords

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  • EP ID EP650041
  • DOI 10.24297/ijct.v7i3.3440
  • Views 68
  • Downloads 0

How To Cite

Sunil Kumar, Arun Kr. Chatterjee (2013). Comparative study of different Sense Amplifiers in 0.18um technology. INTERNATIONAL JOURNAL OF COMPUTERS & TECHNOLOGY, 7(3), 615-619. https://europub.co.uk/articles/-A-650041