Dendrite Growth Model at Bonded (001) GaAs Interface

Abstract

A periodic GaAs wafer-bonded structure was used for nonlinear optical device. Results showed voids present at the bonded GaAs twin boundary. These voids were caused by natural topographical irregularities and surface contamination. Most contamination could be eliminated by sulfur passivation treatments. However, natural irregularities are inevitable. After bonding, two kinds of crystallites were formed at the bonded (001) interfacial voids: diamond-shaped and dendritic geometries. This paper discussed the dendrite growth models within the interfacial void regions.

Authors and Affiliations

Yew Chung Sermon Wu, A. Panimaya Selvi Isabel

Keywords

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  • EP ID EP389067
  • DOI 10.9790/1676-1201035459.
  • Views 121
  • Downloads 0

How To Cite

Yew Chung Sermon Wu, A. Panimaya Selvi Isabel (2017). Dendrite Growth Model at Bonded (001) GaAs Interface. IOSR Journals (IOSR Journal of Electrical and Electronics Engineering), 12(1), 54-59. https://europub.co.uk/articles/-A-389067